Wafer Structural Light Surface Shape Detection Equipment

Applications

Wafer flatness detection.

Working Principle

The point cloud distribution and curvature distribution of the measured surface are calculated according to the

deformation of the light stripe, and the surface shape error distribution can be obtained by comparing the point

cloud distribution with ideal model.

Features

Detection Image

Our Advantages

We are manufacturer.

Mature process.

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Our ISO Certification

Parts of Our Patents

Parts of Our Awards and Qualifications of R&D

ZEIT Group, founded in 2018, is a company focused on precision optics, semiconductor materials and hightech intelligence equipments. Based on our advantages in precision machining of core and screen, optical detection and coating, ZEIT Group has been providing our customers with complete packages of customized and standardized product solutions.

Concentrated on technological innovations, ZEIT Group has more than 60 domestic patents by 2022 and established very close enterprise-college-research cooperations with institutes, universities and industrial association worldwide. Through innovations, self-owned intellectual properties and building up the key process experimental teams, ZEIT Group has become a development base for incubating high-tech products and a training base for high-end personnels.

      2018                                 70+                                     5+

      Founded                                                           Patents                                           Head office :  Chengdu, P.R.China

                                                                                                                                        Subsidiary :  Suzhou  /  Zhangjiagang, P.R.China

                                                                                                                                               Office ：Xi’an，P.R.China  /  Germany