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| Brand Name : | ZEIT |
| Model Number : | SBD-UV-X—X |
| Certification : | Case by case |
| Price : | Case by case |
| Payment Terms : | T/T |
| Supply Ability : | Case by case |
| Delivery Time : | Case by case |
UV Stress Birefringence Detection Equipment
Applications
| UV-ultraviolet | Semiconductor |
| Light source raw material manufacturer |
Working Principle
In the process of measurement, we can measure the sample in view once to fully master the stress distribution.
Quantize measurement results by two-dimensional charts.
Features
| Model | SBD-UV-X—X |
| Working mode | Real-time measurement |
| Function | Stress magnitude, stress distribution |
| Detection wave band | VIS-520nm, 590nm, 650nm |
| Test range | 1~110nm& 1~280nm |
| Spatial resolution | 0.05mm |
| Test repeatability | 0.1nm |
| Measurement frequency | >15FPS |
Note: Customized production available. | |
Detection Images




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